Scanning Transmission Electron Microscopy Facility
Comparison to Other Imaging Techniques (See Wiki of underlined terms)
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Biological STEM: (BNL, Engel, Leapman, Ortega) emphasis on low-dose, dark field imaging of very thin specimens
(~2nm resolution), quantitative imaging (mass mapping), specific heavy atom labels, low-Z negative staining.
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Materials science STEM: (CFN, Pennycook, etc.) emphasis on high-dose, small probe
(<0.1nm resolution with spherical aberration correction), electron energy loss spectroscopy (EELS) and micro-area diffraction.
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Bright field TEM: emphasis on stained thin sections, complexes in high-Z negative stain. ~2nm resolution)
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Dark field TEM: emphasis on thin specimens, similar to dark field STEM but 20x higher dose and non-linear image intensity.
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Phase contrast TEM: emphasis on frozen-hydrated specimens (~0.5nm resolution with image averaging)
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Secondary electron SEM (Scanning Electron Microscopy): emphasis on surface imaging of solid specimens after drying or freeze-fracturing followed by metal shadowing. (~2nm resolution)
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AFM (Atomic Force Microscopy): emphasis on thin specimens on flat surfaces (mica), can be done in liquid (~2nm resolution)
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STM (Scanning Tunneling Microscopy):
emphasis on conducting properties of flat metal specimens (~0.2nm resolution).
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X-ray Crystallography: emphasis on 3-D imaging of objects in crystals (~0.2 nm resolution in 3-D)
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Confocal Optical Microscopy: emphasis on 3-D imaging of living tissue with specific fluorescent labels (~200nm resolution in 3-D and msec.)
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Last Modified: June 12, 2009 Please forward all questions about this site to:
Denise Monteleone
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