Scanning Transmission Electron Microscopy Facility
STEM Operating Parameters
BNL STEM 1
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V0
Source
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40 keV
Cold FEG
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| Probe |
0.25 nm |
| Beam Intensity |
10³ el/pixel |
| Dark Field |
15 - 40 mR and 40 - 200 mR |
Specimens on X,Y Stage |
6 Samples in Vacuum at 20° or -180°C |
| Data Aquisition |
Windows PC |
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Last Modified: June 12, 2009 Please forward all questions about this site to:
Denise Monteleone
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