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Transmission Electron MicroscopeOperated by Brookhaven's Materials Science Department, the 300,000 electron-volt high-resolution Transmission Electron Microscope (TEM) was manufactured under Brookhaven's direction by the Japanese Electro-Optical Laboratory of Tokyo. A structure characterization facility that can be used on various materials, TEM produces information that complements both neutron and synchrotron x-ray studies.
Another unique capability of this TEM is its minimum probe size -down to approximately 0.3 nm. This is extremely useful for nano-technology research, which can reveal remarkable amounts of structural information from a sub-nanometer volume.
Last Modified: January 31, 2008 |