The JEOL 2100F is a versatile general user field emission
transmission electron microscope suitable for high-resolution imaging,
Z-contrast imaging and offering chemical analysis capabilities. It can
be operated at variable voltages between 80-200 kV both in scanning
transmission and transmission electron microscopy mode (STEM/TEM). It is
equipped with a Schottky field-emitter and two exchangeable
objective-lens pole-pieces (an ultra high-resolution pole-piece with a
0.19 nm point-to-point resolution allowing ±20° sample tilt, and a
high-resolution pole-piece with a 0.23 nm point-to-point resolution and
±30° sample tilt).
All the holders can be operated with piezo-drift compensation.
The JEOL 2100F is a user-friendly TEM. Access to the microscope is granted via the Electron Microscopy Facility user program. Users can be trained to operate the instrument upon request submitted together with their proposals. Two sessions per day are available for users on this TEM (9am - 1pm, 1pm - 5pm).