Recent Workshops
Advanced Electron Microscopy Workshop
The CFN organized jointly with Hitachi High Technologies America a
workshop on Advanced Electron Microscopy in Materials Physics, on
November 8-9, 2007. This two-day workshop at the CFN featured
presentations by internationally prominent scientists working at the
frontier of electron microscopy, both on instrumentation development and
applications in materials science. The workshop was structured to
stimulate scientific exchanges and explore new capabilities. Workshop
topics included advances in aberration-corrected electron microscopy,
high-resolution imaging (STEM & TEM), high-resolution electron
energy-loss spectroscopy, and structure-property relationships of nanomaterials.
Invited speakers included Manfred Ruehle, Max Haider, Phil Batson, Koji
Kimoto, and Angus Kirkland.
Advanced Electron Microscopy in Materials Physics Workshop attendees.
Industry Workshop
On November 13, 2007, the CFN hosted a workshop on Nanoscience Opportunities for the High Tech Industry. Representatives from high-tech companies heard about the CFN's research program and its advanced instruments; met with CFN staff and explored opportunities to solve nanotech problems; discussed how the CFN and BNL can help the nanotechnology industry; learned about other Brookhaven user facilities, such as the National Synchrotron Light Source; toured the new CFN facilities; and learned how to become a CFN user.
Participants in the workshop on Nanoscience Opportunities for the High Tech Industry, in the CFN lobby.
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> Next article: Joint NSLS and CFN Users’ Meeting
