Phone:(631) 344-5174
Email: kisslinger@bnl.gov

Kim Kisslinger

Kim Kisslinger

Electron Microscopy

Kim Kisslinger is a senior TEM technical staff member in the Center for Functional Nanomaterials (CFN) at Brookhaven National Laboratory. Kim has over 12 years of experience in the semiconductor industry (most recently with Intel Corp) as a Transmission Electron Microscopy technician producing TEM samples and performing TEM/STEM analysis. Kim's primary responsibility at CFN is to conduct electron-transparent sample preparation using various mechanical and non-mechanical thinning methods including tripod polishing, dimpling, jet etching, ion-milling, and focused-ion-beam (FIB) techniques in support of users and scientific staff. Kim is also in charge of maintaining and managing the TEM preparation laboratories at CFN.

Mailing Address:
Brookhaven National Laboratory
Center for Functional Nanomaterials
Bldg 735
Upton, NY 11973-5000

 

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Last Modified: April 16, 2013
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