In our research we utilize low-energy electron microscope (LEEM) for the real-time, in situ investigations of the nucleation and growth of thin films. We focus particularly on the understanding of the self-assembly mechanisms in the organic layers, as they are crucial for the advancement of the organic electronics. LEEM has excellent capability of combining the real-time, real-space observations of the film morphology with the crystallographic analysis by means of micro-beam low-energy electron diffraction (m-LEED). Moreover, use of the low-energy electrons minimizes irradiation damage to the specimen, making this technique especially valuable for studying thin organic films.
J. T. Sadowski, Pentacene growth on 3-aminopropyltrimethoxysilane modified silicon dioxide, Optical Materials 34, 1635 (2012).
S. D. Senanayake, J. T. Sadowski, J. Evans, S. Kundu, S. Agnoli, F. Yang, D. Stacchiola, J. I. Flege, J. Hrbek, and J. A. Rodriguez, Nanopattering in CeOx/Cu(111): A New Mechanism for Surface Reconstruction and Enhancement of Catalytic Activity, J. Phys. Chem. Lett. 3, 839 (2012).
P. Sutter, J. T. Sadowski, and E. Sutter, Graphene on Pt(111): growth and substrate interaction, Phys. Rev. B. 80, 245411 (2009).
J. T. Sadowski, G. Sazaki, S. Nishikata, A. Al-Mahboob, Y. Fujikawa, K. Nakajima, R. M. Tromp, and T. Sakurai, Single-nucleus polycrystallization in thin film epitaxial growth, Phys. Rev. Lett. 98, 046104 (2007).
J. T. Sadowski, T. Nagao, S. Yaginuma, Y. Fujikawa, A. Al-Mahboob, K. Nakajima, G. E. Thayer, R. M. Tromp and T. Sakurai, Thin bismuth film as a template for pentacene growth, Appl. Phys. Lett. 86, 073109 (2005).