Structural Probing

Contact: Oleg Gang

In-situ structural characterization can be performed for surfaces, thin films nanoparticles, biological complexes, nanofabricated structures and hybrid composites under environmental condition. We utilize the range of x-ray, optical, spectroscopic and scanning probe methods for structure characterization.


Capabilities

  • Multipurpose X-ray Diffractometer, Rigaku Ultima III
    Contact: Oleg Gang
    The system is capable of characterization of thin films, bulks, and surfaces. Supported techniques: small angle scattering, in-plane diffraction, x-ray reflectivity, and powder diffraction. System is equipped with cross beam optics for point or parallel beam geometries.


  • Customized Spectroscopic Ellipsometer J.A. Woollam M-2000 Spectroscopic
    Contact: Dmytro Nykypanchuk
    The instrument allows analysis and mapping of thin films and interfaces, with temperature control in air and in liquids. It includes: a horizontal sample stage, automated sample translations, auto-angle 45-90 deg, wavelength range 210-1690 nm, collimated light beam, CCD camera, sample heater, and in-liquid measurements.


  • CFN Small Angle X-ray Scattering (SAXS) end-station at beamline x9 at NSLS
    Contact: Oleg Gang
    The beamline allows for simultaneous structure probing under the broad range of environmental conditions on scales from molecules to hundreds of nanometers for bulks (SAXS) and surfaces (GISAXS); supports resonant scattering at edges of particular interest to soft and bio- matter - S, Cl, P, K elements.

    The new X9 beamline is capable of x-ray scattering experiments in the energy range of 2-20keV, with a typical X-ray flux of ~10^12 photons per second at 8keV available at the sample (with 0.4mm beam). In addition to conventional SAXS, the endstation is also equipped to perform GISAXS, simultaneous SAXS/WAXS, microbeam SAXS (as small as 10 microns), and time-resolved SAXS, with sample/camera distances of up to 5m. The heart of the instrumentation is a vacuum sample/detector chamber that houses the WAXS detector, linear detector and a hexapod that replaces the traditional stacked-circle sample manipulator. The linear detector is a unique NSLS design featuring an 8 cm strip of 640 silicon elements with a 0.125 mm spacing.


  • UV-Vis/NIR Spectrophotometer; PerkinElmer Lambda 950
    Contact: Dmytro Nykypanchuk
    High performance UV/Vis/NIR spectrophotometer with temperature control capabilities, operating range 175 nm - 3300 nm.


  • Environmental Closed Loop Atomic Force Microscope; Asylum MFD-3D-BIO
    Contact: Dmytro Nykypanchuk
    Low noise performance with close loop sensors in all 3 axes. Nanopositioning system, head equipped with narrowband filter and topview IO optics and XY scanning stage. Standard scan modes include Q-controlled ac (with phase), contact mode (with lateral force), force curves and force volumes. Nanolithography and nanomanipulation included with custom scripting software.


  • Total Internal Reflection Microcopy System (TIRF); Olympus IX81-ZDC
    Contact: Oleg Gang
    Total internal reflection fluorescence (TIRF) microscope utilizes an evanescent wave which penetrates into the medium of a lower refractive index up to a few hundred nanometers. This shallow penetration allows for selectively excitation of fluorophores within a few hundred nanometers of the optical interface. Our equipment includes 3 color excitation (red, green, or blue laser beam, respectively 633, 543, or 488 nm). The instrument can also be used as a standard wide field fluorescence microscope, with mercury lamp excitation, and includes a high sensitivity EMCC camera. TIRF system can operate as stand alone or integrated with Asylum Research MFP-3D AFM.


  • Epifluorescent and Polarized Microscope Olympus BX51
    Contact: Dmytro Nykypanchuk


  • Dynamic Light Scattering; Malvern Zetasizer Nano ZS and Zeta Potential
    Contact: Dmytro Nykypanchuk
    Measures size (0.6nm to 6000 nm), molecular weight, and zeta potential of dispersed particles and molecules in solution. Includes 4mW 633 He-Ne laser and research software.

Macromolecular and Nanomaterial Synthesis & Assembly


Optical Methods and Energy Transfer Characterization

 

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Last Modified: May 6, 2008
Please forward all questions about this site to: Stephen Giordano.