|
|
Structural Probing
Contact: Oleg Gang
In-situ structural characterization can be performed for surfaces, thin films nanoparticles, biological complexes, nanofabricated
structures and hybrid composites under environmental condition. We utilize the range of x-ray, optical, spectroscopic and scanning
probe methods for structure characterization.
Capabilities
- Multipurpose X-ray Diffractometer, Rigaku Ultima III
Contact: Oleg Gang
The system is capable of characterization of thin films, bulks, and surfaces. Supported techniques: small angle
scattering, in-plane diffraction, x-ray reflectivity, and powder diffraction. System is equipped with cross beam
optics for point or parallel beam geometries.
- Customized Spectroscopic Ellipsometer J.A. Woollam M-2000 Spectroscopic
Contact: Dmytro Nykypanchuk
The instrument allows analysis and mapping of thin films and interfaces, with temperature control in air and in liquids.
It includes: a horizontal sample stage, automated sample translations, auto-angle 45-90 deg, wavelength range 210-1690 nm,
collimated light beam, CCD camera, sample heater, and in-liquid measurements.
- CFN Small Angle X-ray Scattering (SAXS) end-station at beamline x9 at NSLS
Contact: Oleg Gang
The beamline allows for simultaneous structure probing under the broad range of environmental conditions on scales from
molecules to hundreds of nanometers for bulks (SAXS) and surfaces (GISAXS); supports resonant scattering at edges of particular
interest to soft and bio- matter - S, Cl, P, K elements.
The new X9 beamline is capable of x-ray scattering experiments in the energy range of 2-20keV, with a typical X-ray flux of ~10^12
photons per second at 8keV available at the sample (with 0.4mm beam). In addition to conventional SAXS, the endstation is also
equipped to perform GISAXS, simultaneous SAXS/WAXS, microbeam SAXS (as small as 10 microns), and time-resolved SAXS, with sample/camera
distances of up to 5m. The heart of the instrumentation is a vacuum sample/detector chamber that houses the WAXS detector, linear
detector and a hexapod that replaces the traditional stacked-circle sample manipulator. The linear detector is a unique NSLS design
featuring an 8 cm strip of 640 silicon elements with a 0.125 mm spacing.
- UV-Vis/NIR Spectrophotometer; PerkinElmer Lambda 950
Contact: Dmytro Nykypanchuk
High performance UV/Vis/NIR spectrophotometer with temperature control capabilities, operating range 175 nm - 3300 nm.
- Environmental Closed Loop Atomic Force Microscope; Asylum MFD-3D-BIO
Contact: Dmytro Nykypanchuk
Low noise performance with close loop sensors in all 3 axes. Nanopositioning system, head equipped with narrowband filter and topview
IO optics and XY scanning stage. Standard scan modes include Q-controlled ac (with phase), contact mode (with lateral force), force
curves and force volumes. Nanolithography and nanomanipulation included with custom scripting software.
- Total Internal Reflection Microcopy System (TIRF); Olympus IX81-ZDC
Contact: Oleg Gang
Total internal reflection fluorescence (TIRF) microscope utilizes an evanescent wave which penetrates into the medium of a lower
refractive index up to a few hundred nanometers. This shallow penetration allows for selectively excitation of fluorophores within a
few hundred nanometers of the optical interface. Our equipment includes 3 color excitation (red, green, or blue laser beam, respectively
633, 543, or 488 nm). The instrument can also be used as a standard wide field fluorescence microscope, with mercury lamp excitation, and
includes a high sensitivity EMCC camera. TIRF system can operate as stand alone or integrated with Asylum Research MFP-3D AFM.
- Epifluorescent and Polarized Microscope Olympus BX51
Contact: Dmytro Nykypanchuk
- Dynamic Light Scattering; Malvern Zetasizer Nano ZS and Zeta Potential
Contact: Dmytro Nykypanchuk
Measures size (0.6nm to 6000 nm), molecular weight, and zeta potential of dispersed particles and molecules in solution. Includes
4mW 633 He-Ne laser and research software.
Macromolecular and Nanomaterial Synthesis & Assembly
Optical Methods and Energy Transfer Characterization

Last Modified: May 6, 2008 Please forward all questions about this site to:
Stephen Giordano.
|