BNL Chemistry Department Facilities and Instrumentation
Brookhaven’s Center for Radiation Chemistry Research (ACER) is located in BNL's Chemistry Department. It includes a 60Co gamma-source (0.5 MRad / hr.), a 2 MeV Electron Van de Graaff accelerator with transient absorption detection on the full UV-Vis spectral range (200-800 nm, time resolution ~40 ns), and the Laser-Electron Accelerator Facility (LEAF) based upon a 9 MeV RF photocathode electron gun accelerator. A regeneratively-amplified femtosecond laser system provides 266 nm illumination of the photocathode and other wavelengths (800 nm fundamental, 400 nm second harmonic, and 240-2600 nm by optical parametric amplification) for probe beams. Transient absorption detection systems at LEAF include a pulse-probe apparatus (resolution ~7 ps, 240-1600 nm), an ultrafast-single-shot apparatus (resolution ~10 ps, 400-950 nm) and a digitizer-based apparatus (detector dependant resolution from 150 ps to 5 ns, from 250-2500 nm). A spectrally resolved pulse-probe experiment is planned (resolution ~7 ps, 450-1600 nm).
Other Equipment Available at the Chemistry Department. RXM-100 unit for the characterization of high-surface area catalysts and powders (including instrumentation for the determination of surface areas, temperature programmed reduction or oxidation, a couple of flow reactors for catalytic tests, and reaction products analysis by a mass spectrometer or gas chromatograph); Molecular Beam apparatus with triply-differentially pumped beam source, UHV scattering chamber with integral mass spectrometer and sample preparation and characterization tools (LEED, AES, TPD, PVD); Surface photochemistry apparatus with surface science characterization and sample preparation tools (TPD, AES, LEED), VUV laser source, and time-of-flight mass spectrometer with ion imaging for spatial distributions; Nanoparticle deposition apparatus with gas-phase nanocluster ion source, ion transport and mass selector, UHV sample chamber with surface characterization (UPS/XPS, AES, TPD, 2PPE);.Four UHV chambers with diverse instrumentation for surface characterization (LEED, UPS, XPS, AES, TPD, ISS. They allow detailed studies of chemical reactions on solid surfaces); Variable temperature scanning tunneling microscope that allows cooling of the surface to 30 K and heating to 800 K; Varian AA240FS atomic absorption spectrometer; Ocean Optics Fiber Optic Oxygen Sensor System with computer-controlled Hamilton Microlab 500 Series flow-mixing sample delivery system; and a whole range of electrochemical instrumentation, including one PARC 270, four Voltalab 10-40 potentiostats, BAS 100 and CHI 604 electrochemical analyzers four sets for rotating disk-ring measurements with two Pine bipotentiostats, two Molecular Imaging STMs for in situ surface structural studies, a fast-scan NEXUS 670 Nicolet and Mattson Research Series FTIR spectroscopes for in situ infrared studies, UHV chamber for crystal preparation, RF induction heater adapted for annealing reactive metals, standard equipment for wet-chemistry and high-temperature synthetic work.
Instrumentation at the Center for Functional Nanomaterials (CFN)
Existing equipment includes (but not exhaustively): Elmitec LEEM III, VT UHV STM (Custom Built), Omicron VT UHV STM, Molecular Imaging Fluid and Environmentally Controlled STM, AFM, Electrochemistry, JEOL JEM 3000F and JEM 4000Ex TEM, JEOL JEM 2200FS and JEM 2010FEF TEM, JEOL JSM6400 SEM, PHI 699 Scanning Auger, SILAR robot (Gilson), PLD (Neocera), E-beam evaporator, Lab X-ray diffraction (Rigaku Miniflex), UV spectrometer (Flororat-02-Panorama, Spectrodyn Technologies), Differential Scanning Calorimetry/Thermogravimetric Analysis (DTA/TGA, Netsch), Optical microscopes (Nikon), ICP/AES (Hewlett Packard), AFM (Nanoscope II) Major equipment has been ordered for: Facility for Surfaces, Interfaces, Catalysis—Proximal Probes; Transmission Electron Microscopy Facility; Nanopatterning Facility; Facility for Electronic Materials and Inorganic Nanomaterials; and Facility for Soft and Bio-nanomaterials.
Last Modified: March 19, 2015