Materials Characterization
Research Group Homepage
The Condensed Matter Physics & Materials Science Department at Brookhaven National Laboratory
offers a wide range of services to the Laboratory and its users.
Services are paid for by Intra-Laboratory Requisition ( ILR ). The
following is a list of materials characterization techniques which are
available:
- TEM
Analysis - including imaging, electron diffraction, energy
dispersive x-ray analysis, and electron energy loss spectroscopy.
- SEM
Analysis - including imaging, image analysis, and both
quantitative and qualitative x-ray analysis.
- Scanning
Auger - surface analysis, imaging, and depth profiling.
- X-Ray
Techniques - X-ray powder diffraction and Laue
Back-reflection.
- TGA-DTA
- Optical
Microscopy - brightfield and polarized light microscopy to ~
1500x magnification.
- Single
Crystal Preparation - Cutting and polishing single crystals.
- Sample
Preparation -Cross-sectioning and polishing of bulk samples.
- Mechanical
Testing - Tensile and compression testing.

Last Modified: August 2, 2011 Please forward all questions about this site to:
Kim Mohanty
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