:: Next CMPMS Seminar

Thursday, February 16, 2012
"Quantifying transient dynamics in materials using time resolved in situ TEM"
11:00 AM, bldg. 735, Room B

Materials Characterization

Research Group Homepage

The Condensed Matter Physics & Materials Science Department at Brookhaven National Laboratory offers a wide range of services to the Laboratory and its users. Services are paid for by Intra-Laboratory Requisition ( ILR ). The following is a list of materials characterization techniques which are available:

  • TEM Analysis - including imaging, electron diffraction, energy dispersive x-ray analysis, and electron energy loss spectroscopy.
  • SEM Analysis - including imaging, image analysis, and both quantitative and qualitative x-ray analysis.
  • Scanning Auger - surface analysis, imaging, and depth profiling.
  • X-Ray Techniques - X-ray powder diffraction and Laue Back-reflection.
  • TGA-DTA
  • Optical Microscopy - brightfield and polarized light microscopy to ~ 1500x magnification.
  • Single Crystal Preparation - Cutting and polishing single crystals.
  • Sample Preparation -Cross-sectioning and polishing of bulk samples.
  • Mechanical Testing - Tensile and compression testing.

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Last Modified: August 2, 2011
Please forward all questions about this site to: Kim Mohanty