Scanning Electron
Microscopy ( SEM )
Materials
Characterization Home | CMPMSD Home |
Contacts

JEOL 6400 equipped with a light element Energy
Dispersive Spectrometer ( EDS ) and 4-crystal wavelength spectrometer (
WDS ).
- Imaging of samples from 10x to 100,000x magnification
- Image
analysis and particle sizing
- Chemical
analysis using EDS and WDS techniques
- X-ray mapping and x-ray
line profiles
- Electron Channeling
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Imaging and Chemical Mapping |
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Cross-section of a Nb3Sn Wire |
Nb map |
Sn map |
Cu map |
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Last Modified: January 31, 2008 Please forward all questions about this site to:
Kim Mohanty
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