1. Center for Functional Nanomaterials Seminar

    "Development and Implementation of Diffraction Imaging Techniques"

    Presented by Shashidhara Marathe, PhD

    Wednesday, March 11, 2015, 10 am
    CFN, Bldg. 735, conference room A, 1st fl.

    Hosted by: Kevin Yager

    Center for Functional Nanomaterials Seminar Wednesday, March 11, 2015 10:00 a.m. - 11:00 a.m. Conference Room A, 1st floor Development and Implementation of Diffraction Imaging Techniques using Coherent Beams Shashidhara Marathe, PhD This presentation describes development of two different diffraction imaging techniques using coherent beams. At first, I will elucidate the Coherent Diffraction Imaging (CDI) technique implemented in reflection geometry for surface image reconstruction. It will be shown that the reflected intensity from the sample surface, measured in the Fraunhofer region, can be used to retrieve the exit wave phase information, quantitatively, without a priori knowledge of the object [1]. For practical applications, where objected to be reconstructed is laying on a substrate, it is much more desirable to use the reflection based CDI rather than the conventional CDI in transmission mode. Efforts in developing CDI techniques using hard x-ray sources at the Advanced Photon Source (APS), USA, and the Pohang Light Source (PLS), South Korea, will also be discussed. Next, I will talk about development and implementation of X-ray Grating Talbot Interferometer (XGTI) at the APS, Argonne National Laboratory (ANL), IL, USA. This is a tri-modal, non-destructive x-ray imaging technique which not only generates the radiograph of the object under investigation but also the differential phase and the dark-field (SAXS) images, simultaneously, from a single interferogram. In particular, I will talk about developing the single-grating x-ray Talbot Interferometer. A single-grating x-ray Talbot interferometer makes full use of the beam coherence available with synchrotron source compared to other laboratory based x-ray sources. This simplifies the setup and the alignment. Moreover, this technique is very useful for in-situ, time-resolved, measur