Center for Functional Nanomaterials Seminar
"Exploring Nanostructured Materials and Devices by In-situ Transmission Electron Microscopy and Holography"
Presented by Kai He, University of Maryland
Tuesday, March 12, 2013, 10 am
Bldg. 735 - Conf Rm B
Hosted by: Dong Su
The rapid advances in synthesis and fabrication of nanostructures have promoted tremendous growth in the areas of nanoscience and nanoengineering. Further development directs to exploring new novel nanomaterials and achieving real devices utilizing these nanostructured building blocks or architectures, either of which requires a better understanding of material's intrinsic properties on the nanoscale. Modern transmission electron microscopy (TEM) opens up a way for acquiring enhanced knowledge of basic structural properties at the atomic level. Further beyond conventional TEM, in-situ techniques allow us to learn new insights of functionalities of individual materials and integrated devices. In this talk, I will overview our recent work on various nanostructures using in-situ TEM and electron holography, and then focus on a few studies such as mapping potential distributions of p-n junction and Schottky barrier in a working Si nanowire diode, determining magnetic domain structures and measuring intrinsic parameters of Fe3O4 nanoplates, as well as direct visualizing electrochemistry processes for rechargeable battery devices. These approaches can provide detailed information for understanding underlying sciences and engineering desirable devices for emerging technologies.