Center for Functional Nanomaterials Seminar
"The Physics of Superresolution Fluorescence Microscopy"
Presented by Jörg Enderlein, Institute of Physics ��" Biophysics, Georg-August-University Göttingen, Germany
Wednesday, February 26, 2014, 10:30 am
Bldg. 735, Conferenece Room A
Hosted by: Mircea Cotlet
Center for Functional Nanomaterials Seminar Jörg Enderlein The Physics of Superresolution Fluorescence Microscopy Institute of Physics ��" Biophysics, Georg-August-University Göttingen, Germany Wednesday, February 26, 2014 11:00 a.m. Bldg. 735 ��" Conf. Rm. A Classical fluorescence microscopy is limited in resolution by the wavelength of light (diffraction limit) restricting lateral resolution to ca. 200 nm, and axial resolution to ca. 500 nm (at typical excitation and emission wavelengths around 500 nm). However, recent years have seen a tremendous development in enhanced-resolution and super-resolution techniques of fluorescence microscopy, pushing the spatial resolution much beyond its diffraction limit. The presentation provides a general introduction into and overview of this exciting and rapidly evolving field, starting with a basic explanation of the diffraction limit and then presenting, step by step, the different techniques which try to circumvent it. In particular, I will discuss in detail Structured Illumination Microscopy (SIM) and its numerous variants, Stimulated Emission Depletion (STED) Microscopy, super-resolution microscopy techniques which are based on single molecule localization such as Photactivatable Localization Microscopy (PALM) or Stochastic Optical Reconstruction Microscopy (STORM), but also lesser known methods such Stochastic Optical Fluctuation Imaging (SOFI) and Metal Induced Energy Transfer (MIET) Imaging. Host: Mircea Cotlet Joann Tesoriero Center for Functional Nanomaterials P.O. Box 5000 Bldg. 735 Upton, NY 11973 Tel: (631) 344-7791 Fax: (631) 344-7769 Tesoriero@bnl.gov