2010 SAC Review
The 2010
call for NSLS-II beamline development proposals generated 54 proposals.
Each proposal is assigned to one of seven
Science Advisory
Committee (SAC) study panels in specific areas of science and technology:
- Biological and
Environmental Chemistry, meeting July 8-9, 2010
- Materials Science, July
12-13, 2010
- Advanced Engineering
Materials Studies, July 13-14, 2010
- Condensed Matter Physics,
July 19-20, 2010
- Structural Biology, July
20-21, 2010
- Structural Chemistry and
Catalysis, July 21-22, 2010
- Imaging and Microscopy,
July 29-30, 2010
Members of the SAC study panels are listed
here.
The full SAC will convene on August 12-13, 2010, to consider and discuss the
reports from the seven study panels and to make overall recommendations.
See documents associated with the SAC review:
For more information about the SAC review, contact
Qun Shen, Experimental Facilities Division Director, NSLS-II.
SAC Study Panels and Proposal Assignments (spokespersons listed)
Biological and Environmental Chemistry
Thursday-Friday, July 8-9, 2010
- Advanced infrared microspectroscopy (AIM), Lisa Miller
- Full-field infrared
spectroscopic imaging (IRI), Lisa Miller
- Tender energy x-ray
spectroscopy: A facility for high performance and in-situ x-ray absorption
spectroscopy and spatially-resolved XAS of structured materials, optimized
for the tender energy range from 1.2 up to 8 keV (TES), Paul Northrup
- Windowed ultraviolet beamline for VUV circular dichroism and related spectroscopies (WUV), John
Sutherland
- X-ray absorption
spectroscopy for biological, environmental and energy sciences (XAS), Mark
Chance
- X-ray fluorescence
microprobe: A three-pole wiggler x-ray fluorescence microprobe beamline for
characterization of materials in an as-is state (XFM), Antonio Lanzirotti
- X-ray footprinting for in
vitro and in vivo structural studies of biological macromolecules (XFP),
Mark Chance
Materials Science
Monday-Tuesday, July 12-13, 2010
- 4D studies in extreme
environments (4DE), Donald Weidner
- Complex materials
scattering (CMS), Kevin Yager
- Frontier synchrotron
infrared spectroscopy beamline under extreme conditions (FIS), Zhenxian Liu
- NIST spectroscopy beamline
suite: Hard x-ray absorption spectroscopy and diffraction (4.5 keV to 40 keV
three-pole wiggler source) (BMM), Daniel Fischer
- NSLS-II beamline for
combined high magnetic field and high pressure materials studies (HPM),
Trevor Tyson
- NIST spectroscopy beamline
suite: Soft and tender x-ray spectroscopy and microscopy (100 eV to 7.5 keV
canted sources) (SST), Daniel Fischer
- Soft matter interfaces
(SMI), Benjamin Ocko
- Time-resolved x-ray
diffraction and spectroscopy under extreme conditions (TEC), Alexander Goncharov
Advanced Engineering Materials Studies
Tuesday-Wednesday, July 13-14, 2010
- Development of 10-nm x-ray interferometric lithography system at NSLS-II (XIL), Franco Cerrina
- High-energy x-ray
micro-mapping of materials for advanced energy and structural engineering
applications beamline (HEX), Mark Croft and Thomas Tsakalakos
- Materials physics and
processing beamline (MPP), Jean Jordan-Sweet
- Metrology and
instrumentation development (MID), Jeff Keister
- Micron-scale detector
mapping for investigating the non-uniformity in the gamma-ray response of
large-area/volume radiation detectors (MDM), Ralph James
- Monochromatic and white
beam x-ray topography (MWT), Michael Dudley
- NSLS-II beamline for
at-wavelength metrology, in-situ surface figuring, crystal optics,
radiometry, detectors and instrumentation development (OFT), Konstantine
Kaznatcheev
- Radiometry and metrology
(RAM), John Seely
Condensed Matter Physics
Monday-Tuesday, July 19-20, 2010
- A beamline for integrated
in-situ and resonant hard x-ray studies: Illuminating the physics of
materials for the 21st century (ISR), Karl Ludwig
- Hard inelastic x-ray
scattering (HIX), Young-June Kim
- METRO: Infrared beamline
for magneto, ellipsometric & time-resolved optical spectroscopy (MET),
Lawrence Carr
- Photoemission-microscopy
facility for fundamental studies of the physics and chemistry of materials
(ESM), Elio Vescovo
- Soft inelastic x-ray
scattering (SIX), Kevin Smith
- Soft x-ray spectroscopy
and scattering beamline (SSS), Joseph Dvorak
- Ultrafast hard x-ray
(UFH), Rob Crowell
- Ultrafast soft x-ray
(UFS), Dario Arena
Structural Biology
Tuesday-Wednesday, July 20-21, 2010
- High brilliance x-ray
scattering for life sciences (LiX), Lin Yang
- Highly automated biomolecular solution scattering (ABS), Lin Yang
- Flexible access and highly
automated beamline for macromolecular crystallography (AM3), Vivian
Stojanoff
- Flexible access and highly
automated beamline for macromolecular crystallography (AMX), Dieter
Schneider
- Frontier macromolecular
crystallography at an undulator beamline (FMX), Robert Sweet
- NYSBC microdiffraction
beamline (NYX), Wayne Hendrickson
- Single-crystal
spectroscopy and macromolecular crystallography at a 3PW beamline (SM3),
Allen Orville
- Single-crystal
spectroscopy and macromolecular crystallography at an undulator beamline
(SMX), Allen Orville
Structural Chemistry and Catalysis
Wednesday-Thursday, July 21-22, 2010
- Beamline for in situ
studies of chemical transformations by combined, synchronous and quick
x-ray absorption and scattering measurements (QAS), Anatoly Frenkel
- Beamline for studying the
electronic properties of nanomaterials and chemical transformations by
high-resolution photoemission and near-edge x-ray absorption fine structure
(SXS), David Mullins
- Frontier chemical
crystallography beamline (FCC), John Parise
- Inner shell spectroscopy
(ISS), Bruce Ravel
- In situ studies of
chemical transformations with high energy diffraction and IR and Raman
spectroscopy (ICT), Jonathan Hanson
- Powder diffraction beamline for in situ studies of structural and chemical transformations for
developing advanced energy materials developments and industrial
applications (IXD), Jianming Bai
- Time resolved spectroscopy beamline for in situ studies of fast physicochemical properties (TRS),
Anatoly Frenkel
Imaging and Microscopy
Thursday-Friday, July 29-30, 2010
- A superconducting wiggler long beamline at the NSLS-II for medical
imaging and radiation therapy (MIT), Avraham Dilmanian
- Coherent diffractive imaging for biology and materials/nano-science
(CDI), Jianwei Miao and Thomas Earnest
- Coherent diffraction imaging (CDI), Ian Robinson
- Full-field x-ray imaging from micron to nanometer scales (FXI), Jake
Socha and Jun Wang
- Large area condenser zone plate transmission x-ray microscope for
high resolution magnetic and materials science studies (TXM), Gregory
Denbeaux
- Multiscale x-ray diffraction beamline (MXD), Ken Evans-Lutterodt
- nES: the branch-line for high resolution electron spectroscopy (nES),
Yimei Zhu
- Scanned coherent imaging for biological and organic-materials
research group (SCI), Chris Jacobsen
Last Modified: April 2, 2013
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