High-energy x-ray micro-mapping of materials for advanced energy and structural engineering applications beamline (HEX)

May 6, 2011

Brookhaven National Laboratory, Bldg. 725, Seminar Room

Workshop Chair: Mark Croft (email: croft@physics.rutgers.edu, 24/7 contact 732-322-4644)

This workshop will focus on the application of deeply penetrating, high energy and high flux x-rays from a superconducting wiggler, to problems central to this nations technological future, such as the in situ advanced battery electrochemistry characterization during cycling and in situ strain mapping of engineering materials under loading.  The primary objective of the workshop is to incorporate expertise and user community input for the preparation of a NSLS-II, Beamline Development Proposal for such beamline dedicated to the scientific underpinning of engineering and technology .

As will be discussed at the workshop the beamline is currently envisioned to incorporate facets of the layouts of the NSLS X17 A&B beamlines and the JEEP beamline at the UK Diamond Synchrotron (see http://www.diamond.ac.uk/Home/Beamlines/I12/layout.html).  An illustrative white paper, albeit a couple of years old, on some high energy x-ray scattering engineering applications can be found at http://www.physics.rutgers.edu/~croft/papers/WhitePaperEDXRD2-27-08-2100-4-18-08-3-11-09.pdf.  An illustrative recent electrochemistry paper from X17B1 can be found at:  http://www.physics.rutgers.edu/~croft/papers/177-pre-Insitu-sodium-metal-halide-cells.pdf

It should be noted that the proposed beamline will incorporate high energy monochromatic as well as white beam x-ray scattering .  A tomography facet to the beamline will also be discussed.

Speakers

E. Koray Akdogan, Rutgers / Jonathan Almer, APS / Thomas Buslaps, ESRF / Mark Croft, Rutgers U. / Michael Drakopoulos, Diamond Light Source / Matthew P. Miller, Cornell U. / Job Rijssenbeek, GE-Battery Program / Thomas Tsakalakos, Rutgers / Zhong Zhong, BNL

Note: for those wishing to attend who do NOT have a valid BNL ID badge:

      1) Non-US citizens MUST register in the Guest Information System before April 28: http://www.bnl.gov/guv/gis.asp.

Agenda

(subject to revision)

Note: all times include 5 min. for questions.

Session I:  Scientific Cases for "High-energy x-ray mcro-mapping of materials for advanced and structural engineering applications beamline. (HEX)" at NSLS-II

Session II:  Overview of current engineering beamlines (Source chronological order)

Session III:

Administrative Contact:  Lydia Rogers, telephone:  631-344-4746; email: lrogers@bnl.gov

Last Modified: April 2, 2013
Please forward all questions about this site to: BNL Web Services