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High-energy x-ray micro-mapping of materials for advanced energy and structural engineering applications beamline (HEX)

May 6, 2011

Brookhaven National Laboratory, Bldg. 725, Seminar Room

Workshop Chair: Mark Croft (email:, 24/7 contact 732-322-4644)

This workshop will focus on the application of deeply penetrating, high energy and high flux x-rays from a superconducting wiggler, to problems central to this nations technological future, such as the in situ advanced battery electrochemistry characterization during cycling and in situ strain mapping of engineering materials under loading.  The primary objective of the workshop is to incorporate expertise and user community input for the preparation of a NSLS-II, Beamline Development Proposal for such beamline dedicated to the scientific underpinning of engineering and technology .

As will be discussed at the workshop the beamline is currently envisioned to incorporate facets of the layouts of the NSLS X17 A&B beamlines and the JEEP beamline at the UK Diamond Synchrotron (see  An illustrative white paper, albeit a couple of years old, on some high energy x-ray scattering engineering applications can be found at illustrative recent electrochemistry paper from X17B1 can be found at

It should be noted that the proposed beamline will incorporate high energy monochromatic as well as white beam x-ray scattering .  A tomography facet to the beamline will also be discussed.


E. Koray Akdogan, Rutgers / Jonathan Almer, APS / Thomas Buslaps, ESRF / Mark Croft, Rutgers U. / Michael Drakopoulos, Diamond Light Source / Matthew P. Miller, Cornell U. / Job Rijssenbeek, GE-Battery Program / Thomas Tsakalakos, Rutgers / Zhong Zhong, BNL

Note: for those wishing to attend who do NOT have a valid BNL ID badge:

      1) Non-US citizens MUST register in the Guest Information System before April 28:

          2)  US citizens MUST send their names to by May 2  for BNL access.



(subject to revision)

Note: all times include 5 min. for questions.

Session I:  Scientific Cases for "High-energy x-ray mcro-mapping of materials for advanced and structural engineering applications beamline. (HEX)" at NSLS-II
08:30 - 08:40 Introduction  
08:40 - 09:10 Rutgers X17B Program  
  Structural and energy storage engineering science applications of high energy x-ray diffraction Mark Croft, Rutgers
  High Resolution Multiscale Strain and Phase Mapping in Multiphase Nanomaterials by Energy Dispersive Synchrotron Diffractometry E. K. Akdogan / T. Tsakalakos, Rutgers
09:10 - 09:35 In-situ XRD of GE's Sodium metal Halide Battery Job Rijssenbeek,  GE
09:35 - 10:00 Using Crystal-Based Material Models and High Energy X-rays to Understand Multiscale Material Behavior Mathew Miller, Cornell
10:00 - 10:25 Break  
Session II:  Overview of current engineering beamlines (Source chronological order)
10:25 - 10:55 Opportunities for Materials Science using High Energy X-rays Thomas Buslaps, ESRF
10:55 - 11:25 High Energy X-ray Studies of Engineering Materials at the APSs 1-ID Beamline Jonathan Almer, APS
11:25 - 11:35 Break  
11:35 - 12:05 Geoscience Applications of High-Energy Microtomography Mark Rivers, U. Chicago
12:05 - 12:35 The New High Energy Beamline for Engineering, Material Science and Processing at the Diamond Light Source Michael Drakopoulos, Diamond Light Source
12:35 - 1:35 Lunch break  
Session III:
01:35 - 02:00 Discussion Orientation  
  Current X17 Beamline  
  First Draft Proposed HEX Facilities  
  Questions for Discussion Groups  
02:00 - 03:00 Breakout Groups  
03:00 - 03:30 Breakout Discussion Reports  
03:30 - 04:00 Way Forward Discussion  

Administrative Contact:  Lydia Rogers, telephone:  631-344-4746; email:

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Last Modified: April 2, 2013
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