Soft x-ray spectromicroscopy: progress, trend and future development of soft x-ray spectromicroscopy facility (SMF) at the NSLS-II

May 20, 2011

Brookhaven National Laboratory, Bldg. 725 Seminar Room

Workshop Chair: K. Kaznatcheev (kaznatch@bnl.gov, ph. 631-344-7155)

The primary objective of the workshop is to draft a Beamline Development Proposal for National Synchrotron Light Source II for a soft x-ray spectromicroscopy facility (SMF beamline) dedicated to the study of the nanoscale origin of macroscopic (electrical, magnetic and optical) properties of the matter, and the evolution of the system under relevant conditions. The beamline is envisioned to have two branches:

(i)  high energy resolution soft x-ray branch with an energy-resolving power of R~25,000 over the energy range 301200 eV dedicated to the measurement of electronic excitation in nano-compounds by angular resolved photoelectron spectroscopy with spatial resolution exceeding 100nm (nano-ARPES and -RIXS), and,

(ii)  high spatial (~10nm) resolution STXM/TXM branch with moderate energy resolving power (R~3000, E~80-2500eV), high on sample flux and precise control over time and polarization of the photon beam

As such, two branches have complimentary scientific missions:

Spatially resolved ARPES/RIXS branch would aid the study of:

• near Fermi edge band renormalization in nano-compounds
• electronic excitation in novel materials, such as transition metal oxides, where interplay between electron, spin and orbital degrees of freedom results in electronic inhomogeneity and nanoscale phase separations
• novel phenomena, such as the origin of the states inside of superconducting vortexes
• sub-micron size functional devices (such as CNT field effect transistors), which are beyond the sensitivity limit of the conventional PES

STXM/TXM station will be capable

• to image magnetism down to fundamental magnetic length and time scales with elemental sensitivity in advanced multicomponent materials
• to visualize chemical species distribution and their evolution in electrochemical reactions in conditions relevant to moderate batteries and fuel cells operation
• to follow orientation reverse dynamic in liquid crystal optical switch
• control nanoparticles self assembly

The workshop will provide examples of the research performed at the different x-ray microscopy facilities, explore experimental and detection techniques successfully coupled with x-ray microscopy  and identify the needs of the user community for such a beamline.

Speakers

Aaron Bostwick, ALS-LBNL / Chuck Black, BNL-CFN / Yi-De Chuang, ALS-LBNL / Peter Fischer, CXRO-LBNL / Adam Hitchcock, McMaster Univ. / Qun Shen, BNL-PS / Tolek Tyliszczak, ALS-LBNL

Note: for those wishing to attend who Do Not have a valid BNL ID badge:

1. Non-US citizens MUST register in the Guest Information System before May 12:http://www.bnl.gov/guv/gis.asp.
2. US citizens MUST send their names to lrogers@bnl.gov by May 16 for BNL access.

Agenda

Administrative Contact:  Lydia Rogers, telephone:  631-344-4746; email: lrogers@bnl.gov

Last Modified: April 2, 2013
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