Nano Electron Spectroscopy

May 24, 2010

Brookhaven National Laboratory,

Morning:  Bldg. 510, Small Seminar Room / Afternoon:  Bldg. 817, Room 36

Workshop Organizers:  Konstantine Kaznatcheev and Yimei Zhu

A half day workshop focused on soft x-ray and electron microscopy (you do not need to register to the NSLS/CFN user meeting to attend)

The range of phenomena smart materials and devices exhibit can be traced to their multihierarchical sub micron scale organization and so the development of the spatially resolved experimental technique to study electronic structure is essential. Two of such techniques: (i) transmission electron (TEM) and (ii) soft x-ray scanning microscopy (SM) attract half day workshop attention, as aberration corrected TEM breaks sub. angstrom barrier in imaging, diffraction and spectroscopy where SM would reach 10meV energy resolution, essential for accurate valence band description. The speakers highlight recent trend and provide examples of TEM/ SM applications for study nano-materials and heterogeneous system, ultimately aiming to combine their relative strengths in a single instrument.

Speakers

Philip Batson, Rutgers University / Adam Hitchcock, McMaster University / Konstantine Kaznatcheev, Brookhaven National Lab / Maya Kiskinova, Sincrotron Trieste / Tolek Tyliszczak, ALS-LBNL

Agenda

Morning in Bldg. 510, Small Seminar Room

Afternoon in Bldg. 817 Room 36

Administrative Contact:  Lydia Rogers, telephone:  631-344-4746; email: lrogers@bnl.gov

Last Modified: April 2, 2013
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