Submicron Resolution X-ray Spectroscopy (SRX) is an undulator beamline at sector 5-ID providing world-leading, high-throughput spectroscopic imaging capability (2D and 3D) with sub-100 nm spatial resolution and millisecond dwell times/pixel with fly-scan capability. Scientific communities such as environmental sciences, life sciences, and material sciences will take advantage of this beamline to understand complex natural and engineered systems that are heterogeneous on the micron to nanometer scale.
|Energy Range||Wavelength Range||Resolution||Flux||Focused Beam Size|
|4.65 - 25 KeV||0.5 - 2.7Å||ΔE/E ~ 10-4||≈ 1 x 1013 p/s (@12keV)||0.5 μm (hi-flux)|
|≈ 1 x 1012 p/s (@12keV)||50 nm (hi-res)|
The design consists of an undulator beamline optimized to access an energy range of 4.65 - 25 keV. Two sets of Kirkpatrick-Baez (KB) mirror optics will focus the beam creating either a sub-micrometer sized focal spot at high flux or a sub-100 nm spot at moderate flux. A swap between the two setups will be possible in a couple of minutes. The wide energy range will allow the scientific community to address a wide range of research topics, as absorption edges of a large number of elements can be reached with the SRX beamline, allowing elemental mapping as well as spectroscopy studies.