1 J. Cumings, E. Olsson, A. Petford-Long et al., "Electric and Magnetic Phenomena studied by In-Situ Transmission Electron Microscopy," MRS Bulletin 33, 101-106 (2008).

2 R.F. Klie, C. Johnson, and Zhu Y., "Atomic-resolution STEM in the aberration-corrected JEOL JEM2200FS," Microscopy & Microanalysis 14, 104-112 (2008).

3 M. Malac, M. Beleggia, R. Egerton et al., "Imaging of radiation-sensitive sample in transmission electron microscopes equipped with Zernike phase plates," Ultramicroscopy 108, 126-140 (2008).

4 J. Q He, J. C. Zheng, S. Chaudhuri et al., "Self-organization of epitaxial La0.35Pr0.275Ca0.375MnO3 manganite nanorods on NdGaO3 substrates," J. Appl. Phys. (in press).

5 R. F. Klie, Y. Zhao, G. Yang et al., "High-contrast Z-contrast imaging and EELS study of functional oxide materials," Micron (In press).

6 Z. Tan, X. Liu, V. Patel et al., "Aluminum-Oxide Tunnel Barriers for Scalable, Floating-Gate Random-Access Memories," Appl. Phys. Lett. (In press).