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JEOL JEM-1400 Transmission Electron Microscope
» Electron Microscopy FacilityContact: Kim Kisslinger
New software included with the JEM 1400 TEM provides a complete set of tutorials and user guides to help the beginning microscopist familiarize themselves with the instrument, but also allow the more experienced user to explore and utilize more advanced features.
TEM Mode | STEM Mode | |
---|---|---|
Resolution | ||
Lattice Image | 0.20 nm | - |
Point Image | 0.38 nm | - |
Accelerating Voltage | ||
Steps (5) | 40 - 120 kV | |
Variable Steps | 30 V min, step | |
Magnification | ||
Mag Mode | x200 - x1,200,00 | x5000 - x2,000,000 |
Low Mag Mode | x50 - x1000 | x120 - x4000 |
SA Mag Mode | x2000 - x300,000 | - |
Specimen Chamber | ||
Specimen Tilt Angle (x-axis) | +/-25 deg | +/-25 deg |
(+/-70 deg w/optional holder) | (+/-70 deg w/optional holder) |