We have an effort with the goal of being able to study the atomic pair distribution function (PDF) of thin films within the Flucteam. This year we successfully demonstrated that quantitatively reliable PDFs could be obtained from nanomaterials and films using electron diffraction.
Nanocrystalline films of gold, and discrete nanoparticles supported on carbon films were measured using a standard laboratory electron microscope. Data analysis software was written to eliminate the effects of multiple scattering and obtain reliable PDFs from the electron diffraction data. The resuting PDFs could then be modeled with standard PDF modeling software.
This work was the cover article for the May 2012 issue of Z. fur Kristallogr: M. Abeykoon, C. D. Malliakas, P. Juhas, E. S. Bozin, M. G. Kanatzidis, S. J. L. Billinge, Z Kristallogr., 227 248-256