1. Center for Functional Nanomaterials Seminar

    "Automation of TEM Data Acquisition with SerialEM"

    Presented by Dr. Guenter Resch, Nexperion e.U. - Solutions for Electron Microscopy

    Friday, February 3, 2017, 11 am
    Bldg 735, Conference Room A, 1st Floor

    Hosted by: Dmitri Zakharov

    SerialEM is software developed for automated acquisition of TEM data developed by the Mastronarde Group at the University of Colorado Boulder. It is compatible with most of the modern TEM platforms and interfaces with a wide range of detectors from CCD, CMOS, direct detectors and STEM detectors from different manufacturers. Originally designed for acquisition of tilt series for electron tomography of (biological) specimens, SerialEM can be used for numerous different acquisition strategies due to many built-in high level commands and a flexible scripting language. Examples include the automated, large scale acquisition of high quality cryo-TEM data for molecular reconstruction or the interface with the Leica EM CRYO-CLEM system. Guenter's presentation will give a short overview on the background of SerialEM, it's user interface and basic operation, and the more complex functionalities including the navigator and the scripting language.