Optics Fabrication
Patents
“Technique for etching monolayer and multilayer materials”, US patent 9,153,453
“X-ray filter for X-ray powder diffraction”, Patent application filed to USPTO in December 2015 (BSA 14-44)
Publications
- No publications.
Fabrication and testing of a newly designed slit system for depth-resolved X-ray diffraction measurements, J. Sinsheimer, N. Bouet, S. Ghose, E. Dooryhee and R. Conley, Journal of Synchrotron Radiation 23, 1296-1304 (2016)
Development and characterization of monolithic multilayer Laue lens nanofocusing optics, E. Nazaretski, W. Xu, N. Bouet, J. Zhou, H. Yan, X. Huang, Y.S. Chu, Applied Physics Letters 108, 261102 (2016)
MMultilayer Laue Lens: A Brief History and Current Status, R. Conley, N. Bouet, Y.S. Chu, X. Huang, H.C. Kang, A.T. Macrander, J. Maser, E. Nazaretski, G.B. Stephenson, H. Yan, Synchrotron Radiation News 29, 16-20 (2016)
NNew figuring model based on surface slope profile for grazing-incidence reflective optics, L. Zhou, L. Huang, N. Bouet, K. Kaznatcheev, M. Vescovi, Y. Dai, S. Li, M. Idir, Journal of Synchrotron Radiation 23, 1087-1090 (2016)
OOne-dimensional ion-beam figuring for grazing-incidence reflective optics, Zhou, L.; Idir, M.; Bouet, N.; Kaznatcheev, K.; Huang, L.; Vescovi, M.; Dai, Y.; Li, S., Journal of Synchrotron Radiation 23 (1), 182-186 (2016)
MMultimodality hard-x-ray imaging of a chromosome with nanoscale spatial resolution, Yan, H.; Nazaretski, E.; Lauer, K.; Huang, X.; Wagner, U.; Rau, C.; Yusuf, M.; Robinson, I.; Kalbfleisch, S.; Li, L.; Bouet, N.; Zhou, J.; Conley, R.; Chu, Y. S., Scientific Reports 6, 20112 (2016)
11.5 nm fabrication of test patterns for characterization of metrological systems, Babin, S.; Calafiore, G.; Peroz, C.; Conley, R.; Bouet, N.; Cabrini, S.; Chan, E.; Lacey, I.; McKinney, W. R.; Yashchuk, V. V.; Vladar, A. E., Journal of Vacuum Science & Technology B, 33 (6), 06FL01 (2015)
DDiffraction properties of multilayer Laue lenses with an aperture of 102 μm and WSi2/Al bilayers, Kubec, A.; Kujala, N.; Conley, R.; Bouet, N.; Zhou, J.; Mooney, T. M.; Shu, D.; Kirchman, J.; Goetze, K.; Maser, J.; Macrander, A., Opt. Express 23 (21), 27990-27997 (2015)
BBinary pseudo-random patterned structures for modulation transfer function calibration and resolution characterization of a full-field transmission soft x-ray microscope, Yashchuk, V. V.; Fischer, P. J.; Chan, E. R.; Conley, R.; McKinney, W. R.; Artemiev, N. A.; Bouet, N.; Cabrini, S.; Calafiore, G.; Lacey, I.; Peroz, C.; Babin, S., Review of Scientific Instruments 86 (12), 123702 (2015)
AA one-dimensional ion beam figuring system for x-ray mirror fabrication », M. Idir, L. Huang, N. Bouet, K. Kaznatcheev, M. Vescovi, K. Lauer, R. Conley, K. Rennie, J. Kahn, R. Nethery, L. Zhou, Review of Scientific Instruments 86, 105120 (2015)
PPushing the limits: an instrument for hard X-ray imaging below 20 nm, Nazaretski, E.; Lauer, K.; Yan, H.; Bouet, N.; Zhou, J.; Conley, R.; Huang, X.; Xu, W.; Lu, M.; Gofron, K.; Kalbfleisch, S.; Wagner, U.; Rau, C.; Chu, Y. S., Journal of Synchrotron Radiation 22 (2), 336-341 (2015)
EEfficiency of a multilayer-Laue-lens with a 102 μm aperture, Macrander, A. T.; Kubec, A.; Conley, R.; Bouet, N.; Zhou, J.; Wojcik, M.; Maser, J.,. Applied Physics Letters 107 (8), 081904 (2015)
AAchieving hard X-ray nanofocusing using a wedged multilayer Laue lens, Huang, X.; Conley, R.; Bouet, N.; Zhou, J.; Macrander, A.; Maser, J.; Yan, H.; Nazaretski, E.; Lauer, K.; Harder, R.; Robinson, I. K.; Kalbfleisch, S.; Chu, Y. S.,. Opt. Express 23 (10), 12496-12507 (2015)
HHard x-ray nanofocusing by multilayer Laue lenses, Yan, H.; Conley, R.; Bouet, N.; Chu, Y. S.,. Journal of Physics D: Applied Physics 47 (26), 263001 (2014)
EExotic X-ray back-diffraction: a path toward a soft inelastic X-ray scattering spectrometer, Honnicke, M. G.; Conley, R.; Cusatis, C.; Kakuno, E. M.; Zhou, J.; Bouet, N.; Marques, J. B.; Vicentin, F. C.,. Journal of Applied Crystallography 47 (5), 1658-1665 (2014)
DDesign and performance of a scanning ptychography microscope, Nazaretski, E.; Huang, X.; Yan, H.; Lauer, K.; Conley, R.; Bouet, N.; Zhou, J.; Xu, W.; Eom, D.; Legnini, D.; Harder, R.; Lin, C.-H.; Chen, Y.-S.; Hwu, Y.; Chu, Y. S.,. Review of Scientific Instruments 85 (3), 033707 (2014)
111 nm hard X-ray focus from a large-aperture multilayer Laue lens, Huang, X.; Yan, H.; Nazaretski, E.; Conley, R.; Bouet, N.; Zhou, J.; Lauer, K.; Li, L.; Eom, D.; Legnini, D.; Harder, R.; Robinson, I. K.; Chu, Y. S.,. Sci. Rep. 3, 3562 (2013)
HHard X-ray multilayer mirror round-robin on the wavefront preservation capabilities of W/B4C coatings, Rack, A.; Assoufid, L.; Lee, W. K.; Shi, B.; Liu, C.; Morawe, C.; Kluender, R.; Conley, R.; Bouet, N.,. Radiation Physics and Chemistry 81 (11), 1696-1702 (2012)
Nanoresolution radiology of neurons, Wu, H. R.; Chen, S. T.; Chu, Y. S.; Conley, R.; Bouet, N.; Chien, C. C.; Chen, H. H.; Lin, C. H.; Tung, H. T.; Chen, Y. S.; Margaritondo, G.; Je, J. H.; Hwu, Y.,. Journal of Physics D: Applied Physics 45 (24), 242001 (2012)
AAdvanced multilayer Laue lens fabrication at NSLS-II, Conley, R.; Bouet, N.; Zhou, J.; Yan, H.; Chu, Y.; Lauer, K.; Miller, J.; Chu, L.; Jahedi, N. Proc. SPIE - Int. Soc. Opt. Eng. 8502, 850202-1 (2012)
CCalibration of the modulation transfer function of surface profilometers with binary pseudorandom test standards: expanding the application range to Fizeau interferometers and electron microscopes, Yashchuk, V. V.; Anderson, E. H.; Barber, S. K.; Bouet, N.; Cambié, R.; Conley, R.; McKinney, W. R.; Takacs, P. Z.; Voronov, D. L.,. Optical Engineering 50 (9), 093604-093604-12 (2011)
CCharacterization of electron microscopes with binary pseudo-random multilayer test samples, Yashchuk, V. V.; Conley, R.; Anderson, E. H.; Barber, S. K.; Bouet, N.; McKinney, W. R.; Takacs, P. Z.; Voronov, D. L.,. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 649 (1), 150-152 (2011)
MMultilayer Laue Lens Growth at NSLSII, Conley, R.; Bouet, N.; Lauer, K.; Carlucci-Dayton, M.; Biancarosa, J.; Boas, L.; Drannbauer, J.; Feraca, J.; Rosenbaum, L.,. AIP Conference Proceedings 1365, 69 (2011)
WWSi2/Si Multilayer Sectioning by Reactive Ion Etching for Multilayer Laue Lens Fabrication, Bouet, N.; Conley, R.; Biancarosa, J.; Divan, R.; Macrander, A. T., Proc. SPIE - Int. Soc. Opt. Eng. 7802, 780203-1 (2010)
CCalibration of the modulation transfer function of surface profilometers with binary pseudo-random test standards: expanding the application range, Yashchuk, V. V.; Anderson, E. H.; Barber, S. K.; Bouet, N.; Cambie, R.; Conley, R.; McKinney, W. R.; Takacs, P. Z.; Voronov, D. L. Proc. SPIE - Int. Soc. Opt. Eng. 7801, 78010B (2010)
TThe NSLS-II multilayer laue lens deposition system, Conley, R.; Bouet, N.; Biancarosa, J.; Shen, Q.; Boas, L.; Feraca, J.; Rosenbaum, L., Proc. SPIE - Int. Soc. Opt. Eng. 7448, 74480U-1 (2009)
