Hard Inelastic X-ray Scattering (HIX) Workshop
June 9, 2010
Brookhaven National Laboratory, Bldg. 703 Large Conference Room
Workshop Organizers: Young-June Kim (Univ. Toronto), Y. Cai (BNL), John Hill (BNL)
Synopsis: We will propose to build a hard x-ray inelastic x-ray scattering beamline (HIX), which will consist of two spectrometers sharing a common undulator (IVU22-6m). The first is an inelastic x-ray scattering spectrometer with up to 10 meV resolution operating in the energy range of 2.9 keV-15 keV to be used for resonant and non-resonant inelastic scattering. The second spectrometer is a multi-analyzer high-throughput system with 200-300 meV energy resolution for carrying out non-resonant inelastic x-ray scattering and x-ray Raman scattering in extreme sample environments. These instruments will enable us to carry out a diverse science program that will encompass materials, earth and planetary, chemical, and environmental sciences.
The aims of this workshop are:
1) Discussion of analyzer technology, beyond Si and Ge optics, which will be required to achieve the desired performance
2) Formulation of science program and optimization of beamline parameters
All interested parties are invited to attend and to contribute their ideas to the agenda.
Note: for those wishing to attend who do NOT have a valid BNL ID badge:
1) Non-US citizens MUST register in the Guest Information System before June 1st: http://www.bnl.gov/guv/gis.asp.
2) US citizens MUST send their names to firstname.lastname@example.org by June 9th for BNL access.
Last Modified: May 2, 2014