Time-resolved full field x-ray microscopy at nano and micro scale
June 2, 2010
Brookhaven National Laboratory, Bldg. 703, Large Conference Room
Workshop Organizers: Jun Wang, Yong Chu, Kennneth Evans-Lutterodt, Antonio Lanzirotti, Chi-Chang Kao
We will be holding a Workshop on time-resolved full-field transmission x-ray microscopy at nano and micro scales. The purpose of the workshop is to provide a forum to discuss the beamline development proposal to build a time-resolved full field imaging beamline at both nano and micro scale on an insertion device source at NSLS-II. The beamline will support scientific research benefiting from 2D and 3D x-ray imaging with high spatial resolution down to 30nm, high energies (5-25 keV) for larger penetration depths, high sensitivity using differential-absorption and phase-contrast, and faster imaging for investigation of dynamics. The main focus of this workshop is (a) to identify strong scientific cases in the areas of energy storage, biofuels, nano-electronics and materials, and geo and environmental sciences, and (b) to discuss beamline feasibility and its critical parameters. All interested parties are invited to attend and contribute ideas and inputs.
Note: for those wishing to attend who do NOT have a valid BNL ID badge:
1) Non-US citizens MUST register in the Guest Information System before May 27: http://www.bnl.gov/guv/gis.asp.2) US citizens MUST send their names to email@example.com by June 1 for BNL access.
Yu-chen Karen Chen, Northwestern Univ / Wilson Chiu, Univ. Connecticut / Francesco De Carlo, APS / Patrick DeHaven, IBM / Can Erdonmez, MIT / Jonathan Holladay, PNNL / Chi-Chang Kao, BNL / David Mao, Carnegie Inst. Washington / Qun Shen, BNL / Stuart Stock, Northwestern Univ. / Jun Wang, BNL
Last Modified: May 2, 2014