Summary of the analysis of the energy
deposited per particle
at the mid-rapidity region
(addendum to the previous reports on the analysis of the PMC simulations)
Barbara.Wosiek@ifj.edu.pl
March 25,1999
 
 
This is a summary of the analysis of energy deposited per particle at midrapidity. Energy deposited  is studied for tracks  with   -2 <= eta <  2   and only for those which hit Octagon sensors.
In this report the effects of different cuts ('truncations') on the deposited energy are summarized.
The following cuts have been applied:
 
 A.    if(Edep > 1000 keV) Edep = 1000 keV
 B.    if(Edep >   500 keV) Edep =   500 keV
 C.    Edep <= 1000 keV
 D.    Edep <=   500 keV
 E.    20 <=  Edep  <= 500 keV
 In each case and for i-th sample the correction factor fi   was calculated:
 
fi =  (P/TH)i * <Edep>i-1.
 
 
Assuming that the multiplicity reconstruction is tuned to the Hijing central events, one can calculate:
 
         errN =   (Ntrue - Nrec)/Ntrue = (fi - fHijing-central)/fi.
 
 
 The Table I contains the errN values obtained with the calibration to the Hijing central events.
 
 

 

Table I.  errN(%) - tuning to the Hijing-central
Sample
A
      B 
   C
   D
 E
 Hijing inclusive
-2.8
 
 
 
-0.8
 Hijing semi-central
-2.4
 
 
 
-0.8
 Hijing central
0
0
0
0
0
 Hijing plasma 15%
 +6.4
 
 
 
 +4.3 
 Hijing plasma 30%
 +12.1
 +10.5
 +9.5
 +7.6
 +7.6 
 Hijing HBT
  -1.2
 
 
 
 -0.4 
 Venus central
 +11.6
  +9.6
  +7.9 
  +5.8 
+5.8
 
 
Now, the estimates of errN , with the tuning to the Venus central:
 
Table II.  errN(%) - tuning to the Venus-central
Sample
A
      B 
   C
   D
 E
 Hijing inclusive
-16.3
 
 
 
-7.0
 Hijing semi-central
-15.9
 
 
 
-7.0
 Hijing central
-13.2
-10.6
-8.6
-6.2
-6.2
 Hijing plasma 15%
 -5.9
 
 
 
 -1.7 
 Hijing plasma 30%
 +0.5
 +1.1
 +1.7
 +1.9
 +1.9 
 Hijing HBT
  -14.5
 
 
 
 -6.6 
 Venus central
 0
  0
  0 
  0 
0
 
 
 Summarizing, cuts D or E and tuning to the central Hijing events gives the best results for the reconstruction of mid-rapidity multiplicities for different data samples.