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The question now is whether there is common noise which we then have to subtract on an event-by event basis. Common Noise means a correlated change of the pedestal. So if one plots one the ADC value of one channel against the other channel (in the same Read-Out chip) one can look for such correlation's:
The histograms (as suggested by Russell) show the correlation of
the noise between each channel of one readout chip with all the others.
(So I take the first channel on the chip and plot it against channel 2-128;
then I take second channel and plot it against 3-128 and so on ...) Each
WA98 detector is read out by 8 128 channel VA chips.
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