JEOL 2200FS-MCO Aberration Free TEM & STEM

The first instrument in US with double aberration correctors, one for probe-forming lens, and one for objective lens. It is equipped with an in-column energy filter. It is a versatile instrument designed for sub-angstrom spatial resolution imaging both in TEM and STEM mode, quantitative electron diffraction and high energy-resolution for spectroscopy. A monochromator that will provide E~0.1eV for EELS is scheduled to be installed in 2008.