Workshop description;  Workshop agenda;  Workshop poster

SPEAKERS

Phil Batson, Rutgers University

�Nanoscale Structural, Plasmonic and Electronic Behavior Using EELS and Aberration Corrected STEM�

 

Marek Malac, NINT, Canada

�Angle- and Spatially-Resolved EELS�

 

Matt Libera, Stevens Institute of Technology

�Spectroscopic Imaging of Radiation-Sensitive Soft Materials�

 

Huolin Xin, Lawrence Berkeley National Laboratory

�Spatial Resolution, Artifacts, Contrast, Mechanisms and Strategies for Recording EELS Spectroscopic Images for Different Energy Regimes�

 

Nestor Zaluzec, Argonne National Laboratory

�Pushing the Limits of XEDS and EELS Spectroscopy in the Analytical Electron Microscope: Current Technology and Future Prospects�

 

Fred Cosandey, Rutgers University

�Valence and Chemical Determination of Li-Battery Using EELS�

 

Nan Jiang, Arizona State University

�EELS Studies of Materials for Solar Power and Solid-State Battery Applications�

 

Richard McLaughlin, Oxford Instruments

�Challenges and Considerations for EDS Analysis of Nanostructures�

 

 

Neil Rowlands, Oxford Instruments

�Factors Affecting Quantitative EDS Analysis in the TEM�

 

Feng Wang, Brookhaven National Laboratory

�TEM-EELS Studies of Electrode Materials for Li-Ion Batteries�

 

HANDS-ON SESSIONS

Dong Su, CFN

�Chemical Analysis of Interfaces in Functional Oxide Thin Films�

(Instrument: Hitachi HD 2700C STEM)

 

Neil Rowlands, Oxford Instruments; Lihua Zhang, CFN

�Getting the Best EDS Results from your Analytical TEM�

(Instrument: JEOL 2100F HRTEM)

 

Rosa Diaz Rivas, CFN

�Capabilities of Environmental Transmission Electron Microscopy in Catalysis�

(Instrument: FEI Titan 80-300 Environmental TEM)

 

Richard McLaughlin, Oxford Instruments

�Optimizing your SEM and EDS System for Nanoanalysis�

(Instrument: JEOL 7600F HRSEM)

 

Simerjeet Gill, NSTD-BNL; Fernando Camino, CFN

�EDS Mapping of Materials with Different Composition (Phase Mapping)�

(Instrument: FEI Helios dual beam SEM/FIB)