Instrumentation Division Seminar

"Advanced 3D Modeling and Simulations to Improve Designs of Active Pixel CMOS Sensors for Charged Particle Detection"

Presented by Marek Turovski, CFD Research Corporation

Wednesday, November 30, 2005, 11:00 am — Large Seminar Room, Bldg. 535

Monolithic detectors based on Active Pixel Sensors (APS) fabricated in standard CMOS technologies promise significant advantages, but currently several unsolved challenges remain, mostly with the signal-to-noise ratio and slow readout speed. To address these problems, CFDRC proposes to use its own advanced 3D simulation software and the multi-year experience in semiconductor device physics to investigate novel APS design concepts.

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