NSLS-II invites proposals for a Microelectronics Measurements Campaign Pilot focused on developing collaborative experiments that address critical measurement challenges in the development and manufacturing of microelectronics devices. This pilot is intended to bring together researchers from industry, academia, and NSLS-II to tackle high-impact science and technology questions through coordinated experimental campaigns. By combining advanced experimental methods at NSLS-II with complementary measurements and expertise from participating organizations, the pilot aims to accelerate experimentation and data analysis while establishing a new model for sustained collaboration and user access. Selected teams will benefit from coordinated beam time access, close collaboration with NSLS-II scientists on experimental design and measurements, development of data analysis and evaluation workflows, and opportunities to increase the impact for their research. Proposals are due September 30, 2026 and should be submitted through the NSLS-II PASS system. More information