NSLS-II Microelectronics Measurements Campaign Pilot
Call for Proposals
Submission Deadline: Wednesday, September 30, 2026 at 11:59 PM ET.
The National Synchrotron Light Source II (NSLS-II) at Brookhaven National Laboratory invites proposals for a Microelectronics Measurements Campaign Pilot focused on developing collaborative experiments that address critical measurement challenges in the development and manufacturing of microelectronics devices. This pilot is intended to bring together researchers from industry, academia, and NSLS-II to tackle high-impact science and technology questions through coordinated experimental campaigns. By combining advanced experimental methods at NSLS-II with complementary measurements and expertise from participating organizations, the pilot aims to accelerate experimentation and data analysis while establishing a new model for sustained collaboration and user access.
Selected teams will benefit from coordinated beam time access, close collaboration with NSLS-II scientists on experimental design and measurements, development of data analysis and evaluation workflows, and opportunities to increase the impact for their research.
What are Microelectronics Measurement Campaigns?
Microelectronics Measurement Campaigns are coordinated, collaborative, multi-user efforts centered on a shared science and/or technology challenge relevant to the fabrication, characterization, performance, reliability, or continued development of microelectronics devices. Teams will conduct experiments at one or more NSLS-II beamlines, complemented by synthesis, characterization or other measurements at their home institutions and at other user facilities. A central requirement for participation in the pilot is that proposals address a significant scientific question and/or measurement challenge relevant to microelectronics devices or their manufacturing. Participants are expected to work collaboratively with NSLS-II staff to develop the experimental approach and the data analysis and evaluation methods needed to address the proposed research question.
The pilot will use NSLS-II's existing Block Allocation Group (BAG) proposal framework. Proposals must follow standard BAG requirements, including peer-reviewed publication of results and address the additional Microelectronics Measurement Campaign criteria listed below.
Each proposal should address an overarching science and/or technology question or challenge that requires NSLS-II experimental capabilities. Teams must commit to data sharing within the BAG and with NSLS-II, including relevant data from home institutions and partner facilities. Data should include sufficient information to address the research or manufacturing questions posed in the beamtime application. NSLS-II will not share these data beyond the BAG and NSLS-II.
Proposals should clearly describe:
- The science and/or technology challenge to be addressed, its broader impact and the compelling need or advantage for the research.
- The experimental plan at NSLS-II and complementary efforts in the proposers' home labs and at other user facilities
- The data to be generated and shared to allow the creation of analysis/evaluation workflows of general utility to the NSLS-II.
Submissions will be evaluated based on scientific and technical merit, experimental design, and the importance of the microelectronics research problem described. All proposals must include a substantive collaboration with an industry partner. Participation by NSLS-II beamline staff is strongly encouraged. Proposals will be reviewed by the NSLS-II Proposal Review Panels, with final selections within the framework of this pilot made by NSLS-II management.
This pilot emphasizes investigation of science and technology problems to be overcome in continuing the manufacture and development of microelectronics devices. The proposed problems are expected to require collaboration between NSLS-II staff and the other members of the BAG. Selected teams are expected to begin in the January-April 2027 beam time cycle and showcase initial outcomes during or shortly after beam time has been used. NSLS-II will provide support for data-sharing infrastructure and workflows, including pilot platforms for data management and access.
Researchers interested in investigating science and technology problems of importance to the development and manufacturing of microelectronics components and devices are encouraged to apply.
Submission details and deadlines
The deadline for submission of Microelectronics Measurement Campaign Pilot proposals is Wednesday, September 30, 2026 at 11:59 PM ET. Proposals should be submitted through the NSLS-II PASS system following the guidelines for BAG proposals. The proposal titles should be prefaced by [Microelectronics PILOT] followed by the descriptive title text.
Users may find the BAG Proposal template (.docx) handy for writing their proposal and then copying/pasting the information into PASS.
For questions or to discuss potential proposals, please contact the lead beamline scientist(s) or the NSLS-II User Administration Office.
