Friday, November 4, 2016, 11:00 am — ISB Bldg. 734, Sem. Rm. 201 (upstairs)
X-rays are an ideal probe for studying structural properties of matter and, thanks to the brilliance of synchrotron sources, they are also employed to determine the atomic
structure and morphology of surfaces and interfaces.
Surface x-ray diffraction has been originally developed to determine the static structure of surfaces. However with the development of x-ray sources, detectors and analysis tools it is now possible to characterise in detail processes which occur at surfaces. Aim of this talk is to present recent results obtained at the id03 surface diffraction beamline of the ESRF dealing with the in-situ characterization of the structure and
morphology of a catalyst during a surface reaction. Examples will deal with heterogenous catalytic oxidation of CO on single crystal surfaces /1,2/ and supported nanoparticles /3/
References
1 R. van Rijn et al., Phys. Chem. Chem. Phys. 13 (2011) 13167
2 B.L. Hendriksen et al., Nat. Chem. 2 (2010) 730
3 O. Balmes, et al., Phys. Chem.Chem. Phys. 14 (2012) 4796
Hosted by: Ian Robinson
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