Friday, March 29, 2019, 12:00 pm — NSLS-II Bldg 744 Rm 156
Full-field transmission x-ray microscope (TXM) based on Fresnel zone plate is a promising and intuitive manner to take high quality phase contrast images with spatial resolution of tens of nanometers, applicable to both synchrotron radiation and laboratory source. In particular, computed tomography (CT) using hard x-rays of high penetration depth provides a high-resolution 3D image. However, the small field of view (FOV) of ~10 microns provides only a very limited volume (~10-5 mm3) of information. It primarily limits the application area of TXM. In this talk, I present a new type of TXM for CT that enlarge the FOV as large as diameter of the objective zone plate. With this method, sub-millimeter FOV can be realized while maintaining the nano-scale spatial resolution. Through experiment, we obtain more than 1000 times more volume (~10-2 mm3) of information than a typical TXM, at ~200 nm resolution. Its general applicability is demonstrated with integrated chips and Artemia cysts. We believe that this type of TXM can be particularly useful for industrial sample analysis where bulk properties are important.
Hosted by: Ignace Jarrige
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