Friday, May 17, 2019, 11:30 am — Bldg. 735, Conference Room A, 1st Floor
The interest in mechanical properties of two-dimensional materials has emerged in light of new device concepts taking advantage of flexing, adhesion and friction. Here I demonstrate a method to measure adhesion of graphene atop highly ordered pyrolytic graphite (HOPG), utilizing atomic-scale "blisters" created in the top layer by neon atom intercalates. A combination of low-temperature STM, nc-AFM, and DFT has been carried out for this study. Detailed analysis of STM images is used to reconstruct atomic positions and the strain map within the deformed graphene layer. I also demonstrate the tip-induced subsurface translation of neon atoms. An analytical model, originally devised for graphene macroscopic deformations, is applied to determine the graphite adhesion energy, which is in excellent agreement with reported macroscopic values and our DFT simulations. The simplicity of the method provides a unique opportunity to investigate the local variability of nano-mechanical properties and even local exfoliation in layered materials using scanning probe based techniques. Through the talk, I will also highlight some scientific instrumentation projects that I have developed for nanoscience research and some thoughts on the path forward.
Hosted by: Kevin Yager
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