Center for Functional Nanomaterials Seminar

Abstract: Focused ion beam – scanning electron microscope (FIB-SEM) instruments have become extremely valuable tools for materials research. They provide unique capability for micro- and nanoscale fabrication and can be equipped with a range of analytical capabilities including TOF-SIMS and Raman/RISE that make them extremely powerful for materials characterization. In this presentation, some of the basic functions and configurations of FIB-SEM will be outlined and the broad capabilities of FIB-SEM and their application to materials characterization in the FIB-SEM environment will be presented. Bio: Dean Miller is Principal Scientist with Tescan USA. He received his B.S. in Metallurgical Engineering and Ph.D. in Materials Science, both from the University of Illinois in Champaign-Urbana. He was a Senior Materials Scientist at Argonne National Laboratory for 30 years, including serving as Director for the Electron Microscopy Center at Argonne for more than 15 years. His research focuses on the characterization of complex electronic oxides including advanced battery materials, magnetic oxides, and high-temperature superconductors with a particular emphasis on characterization by electron beam methods. Dr. Miller joined Tescan in 2017 as Principal Scientist to provide scientific support and collaboration with researchers and scientists in the community and with Tescan staff.