Thursday, November 10, 2005, 1:30 pm — Small Seminar Room, Bldg. 510
A diverse array of complex materials and structures
are driving the nanotechnology revolution. To understand and design these materials, it is essential to perform
high precision structural characterization at the nanoscale. Often, even sub-Angstrom changes in inter-atomic bond lengths have profound consequences for the functionality of these materials, such as the Jahn-Teller distortion in manganite materials which is ~ 0.2 angstroms. Crystallographic methods are the gold standard for atomic structure determination, however a broad and growing class of materials and nanophase morphologies do not yield to a crystallographic analysis. I will discuss
alternative, more broadly applicable, methods which are emerging for these nanostructure problems. I will describe recent work on the nature of the Peierls distortion in
an incommensurate charge-density-wave (CDW) material, CeTe3.
Hosted by: John P. Hill
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