Tuesday, January 17, 2006, 10:30 am — Seminar Room, Bldg. 725
Roughness is an important parameter of any materials system with interfaces. It is well known that diffuse x-ray scattering can be used to extract structural roughness, its correlation length, and exponent. In the last ten years, use of circularly-polarized light, tuned to the absorption edge of magnetic materials, at synchrotron facilities has enabled the x-ray resonant magnetic scattering (XRMS) technique to characterize the magnetism of nanoscale magnetism, including magnetic roughness. We discuss the development of the theory of XMRS and examples of where it has been applied successfully. We also discuss new applications for XRMS.
Hosted by: Chi-Chang Kao
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