Tuesday, May 2, 2006, 10:30 am — Seminar Room, Bldg. 725
I present the development and application of resonant soft x-ray scattering to chemically heterogeneous, organic materials. Polymer composite latex particles ~200 nm in diameter were utilized to determine the potential utility of this technique. Two styrene-acrylic polymer latex systems were prepared on silicon nitride membranes. Scattering measurements were performed in transmission. Angular scans at photon energies corresponding to strong scattering contrast between specific chemical moieties made it possible to infer the relative effective radii corresponding to the two polymer phases in the structured latex particles. The results show that resonant x-ray scattering will be a powerful complementary tool to neutron- and conventional x-ray scattering as well as NEXAFS spectromicroscopy for the characterization of structured soft condensed matter nanomaterials. Similarly, resonant soft x-ray reflectivity has been explored as a complementary tool and directly compared to conventional x-ray reflectivity and neutron reflectivity. The advantages of the soft x-ray resonant methods are primarily their high, tunable contrast compared to conventional x-ray reflectivity and the lack of special sample preparation requirements, i.e. isotope substitution (deuteration), which is typically required to enhance contrast for neutrons.
Hosted by: Chi-Chang Kao
2930 | INT/EXT | Events Calendar
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