CFN/NSLS Joint Seminar

"The new PEEM at the Swiss Light Source"

Presented by Christoff Quitmann, Swiss Light Source, Switzerland

Thursday, June 15, 2006, 1:00 pm — Seminar Room, Bldg. 725

A new beamline and photoelectron emission microscope at the Swiss Light Source is described. The microscope is used for a variety of studies of surface phenomena.
Aspects of the system design will be presented along with recent results

Hosted by: Chris Jacobsen

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