Wednesday, March 28, 2007, 2:30 pm — Large Seminar Room, Bldg. 535
Scanning x-ray microscopes and microprobes are unique tools for the nanoscale investigation of specimens from the life, environmental and materials sciences. Phase contrast provides a complementary contrast mechanism in addition to the more standard absorption and fluorescence measurements. It can help reduce radiation dose in the
soft x-ray range and provides a means to image the morphology of weakly absorbing specimens at hard x-ray energies.
A segmented detector can be used to image the phase of the specimen in a scanning microscope by measuring the redistribution of intensity in the detector plane due to refraction. We describe the development and application of such a detector for use with higher photon energies at third generation synchrotron sources. A method for the
quantitative reconstruction of amplitude and phase from the data obtained with a segmented detector is also presented.
Hosted by: P. Rehak
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