Friday, September 21, 2007, 10:30 am — Chemistry, Bldg 555, Room 300
Over the last decade there have been numerous attempts to combine scanning probe microscopy and femtosecond pump-probe techniques to realize an ultrafast microscope with nanometer resolution. So far, no satisfactory solution has been presented. I will present an alternative approach to monitor ultrafast dynamics on nanoscale dimensions: The technique of time-resolved 2PPE is applied to a standard photoemission electron microscope (PEEM). In this configuration the photoemission signal collected by the PEEM detector is related to the lifetime of excited (hot) electrons at the sample surface. Our results show that correlation between surface structure and ultrafast (electron) dynamics can be directly monitored by means of this new technique. In principle, this technique is feasible to investigate the characteristics of hot-electron dynamics of surfaces at a spatial resolution of 20 nm and a time resolution of a few femtosconds. In particular, we expect that this technique is a new probe for the physics of charge carriers in nanostructured and low-dimensional systems.
Hosted by: Peter Sutter
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