Monday, January 14, 2008, 11:00 am — Bldg. 735, Conf. Rm. B
Understanding of structure and properties of many useful technological materials and, in particular, functional nanomaterials, has always been propelled by their in-depth studies with advanced TEM/STEM methods of the electron microscopy, trying to address their properties behind determination of atomic coordinates and composition. A brief review of some important materials examined with S/TEM methods (Pd-cluster catalysts, SbCrSe3 1D-ferromagnets, InGaAsP based NIR-lasers/photovoltaics, Ca3Co4O9 -thermoelectrics) will be presented. Phase imaging and phase microscopy, being constantly developed along with conventional TEM/STEM methods, provide higher level of useful information, since may probe electrostatic and magnetostatic potentials of interesting nanoobjects, including magnetic materials and hetero-structures, at nanoscale. Practical use of such methods named as Lorentz phase microscopy (LPM/TEM) and potential applications for novel position-sensitive diffractive imaging (PSDI/STEM) will be outlined.
Hosted by: Yimei Zhu
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