NSLS-II Seminar

"Three Dimensional X-ray Diffraction Microscopy"

Presented by Lawrence Margulies, Risoe National Laboratory, Denmark

Tuesday, July 8, 2008, 9:00 am — NSLS-II Seminar Room, Bldg. 817

The three dimensional x-ray diffraction (3DXRD) microscope is a unique instrument which combines the use of high energy x-rays generated at a synchrotron source with a "tomographic" approach to acquisition of diffraction data, enabling a fast 3D structural characterization of mm-cm sized samples. The position, volume, orientation, grain boundary morphology, elastic and plastic strain can be derived for hundreds of grains simultaneously. The spatial resolution is on the order of 5 microns, while diffracting units of sizes down to 25 nm can be observed. 3DXRD microscopy for the first time enables dynamic studies of the individual grains and sub-grains in polycrystals. Hence, it is possible to observe how the structural elements nucleate, grow, deform or transform and in general how they interact with their local environment. The methodology will be presented and the potential applications illustrated by examples ranging from in-situ deformation and recrystallization to phase transformations.

Hosted by: Qun Shen

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