Monday, July 7, 2008, 10:00 am — Bldg. 735 - Conf. Rm. B
Electron Energy- Loss Spectroscopic Imaging is a powerful method of compositional analysis with sub nanometer spatial resolution. However, in case of biological and organic materials electron beam sensitivity imposes strong limit on the spatial resolution of the method. Using the low loss part of the energy loss spectra helps to relax the dose requirements due to much higher scattering crossection and to improve the resolution.
In this presentation the basic of the technique will be overviewed. Brief example of component mapping of polyamine nanoparticles coated with wax, example of study of Nafion film saturated with organic solvent, and example of study of water distribution in skin will be presented. In spite of high electron beam sensitivity of samples, we demonstrate the spatial resolution as good as 10 nm. Such resolution is unprecedented for such studies and is only possible due to advances in the data analysis that will be described in detail.
Hosted by: Yimei Zhu
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