Monday, August 18, 2008, 10:00 am — NSLS-II Seminar Room, Bldg. 817
Proposed source properties at the NSLS II offer an exciting opportunity to develop hard x-ray microscopy tools with an unprecedented spatial resolution. This presentation will give an overview of several different microscopy techniques. It will discuss effective strategies for utilizing available contrast mechanisms to probe the crystalline structure and chemical status of atoms confined or localized within tens of nanometers or less. This talk will also present the results of on-going scientific research using x-ray diffraction microscopy at spatial resolutions of a few microns to tens of nanometers, with the emphasis on how the techniques developed can be used for designing an effective x-ray microscopy instrument at 10 nm or less.
Hosted by: Qun Shen
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