NSLS-II Seminar

"Two-dimensional projection X-ray diffraction microscopy with Ewald sphere curvature considerations"

Presented by Ning Lei

Wednesday, February 18, 2009, 10:00 am — NSLS-II Seminar Room, Bldg. 817

An approach is proposed to determine the structure of a three-dimensional noncrystalline
object from a single two-dimensional X-ray scattering image. If X-ray absorption is ignored, this method always generates a structure of real electron density, even in the case that the Ewald sphere curvature is large. More importantly, the approach relaxes the requirement of a thin sample by about a factor of two. The reconstructed 2-d projection electron density is the integrated electron density of the sample along a path which makes an angle with the incoming X-rays (z-axis) in proportion to the maximum scattering wavevector transfer magnitude along the axis, revealing the object’s depth information.

Hosted by: Qun Shen

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