Thursday, February 19, 2009, 2:00 pm — NSLS-II Large Conference Room, Bldg. 703
k-Space Associates, Inc., specializes in advanced thin-film characterization
tools and software for MOCVD, MBE, Sputtering, CVD, and related thin film
applications. All k-Space products provide true real-time acquisition,
processing, and analysis. Our kSA BandiT directly measures the temperature
of semiconductor wafers and thin films via band-gap absorption thermometry:
it's non-contact, non-invasive, and real-time measurement down to room
temperature with better than 1 degrees C repeatability without in-situ
calibrations. Multi-beam Optical Sensor (MOS) and MOS Ultra-Scan provide 2D
laser-based curvature and stress measurement of practically any polished
surface with >100km radius-of-curvature detection. kSA RateRat Pro uses
laser reflectivity to provide deposition rate, film thickness, and optical
constants (n,k) of today's most advanced thin films with unmatched signal to
noise. kSA 400 Analytical RHEED system yields powerful surface analysis
during thin-film deposition via sputtering, PLD, and MBE processes.
Hosted by: Ray Conley
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