Tuesday, June 16, 2009, 2:30 pm — Large Conference Room, Building 703
Understanding the behavior of novel materials and minerals at various environmental conditions requires the understanding of its atomic and molecular structure on long-range, intermediate-range and short-range scale. Information on all these length scales could be possible with the application of state-of-the-art X-ray diffraction techniques. In this presentation I will be talking on Crystal Truncation ROD (CTR) a surface sensitive diffraction technique and its application in determining the structure of geochemical interfaces. I will also be discussing on some of the results of the application of Angle and Energy Dispersive X-ray Diffraction (ADXD & EDXD) and Total X-ray Scattering (PDF analysis) techniques in geosciences and materials science.
Hosted by: Qun Shen
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